Education: Ph.D., Physics, University of Oregon M.S., Physics, University of Oregon B.A., Mathematics and Physics, Whitman College
Electronic properties of materials (especially understanding and improving materials for solar cells)
Selected recent publications: J.T. Heath, C. -S. Jiang, and M.M. Al-Jassim, "Measurement of semiconductor surface potential using the scanning electron microscope," J. Appl. Phys. accepted 2012. C. -S. Jiang, J.T. Heath, H.R. Moutinho, and M.M. Al-Jassim, "Scanning Capacitance Spectroscopy on n+-p asymmetrical Junctions in Multicrystalline Si Solar Cells," J. Appl. Phys 110, 014514, (2011). J.T. Heath and P.W. Zabierowsky, "Capacitance spectroscopy of thin-film solar cells," in Advanced Characterization Techniques for Thin-Film Solar Cells, edited by D. Abou-Ras, T. Kirchartz, and U. Rau (Wiley-VCH Verlag GmbH & Co, 2011) Ch. 4. P.K. Johnson, J.T. Heath, J.D. Cohen, K. Ramanathan, and J.R. Sites, "A comparative study of defect states in selenized and evaporated CIGS(S) solar cells," Prog. Photov. 13, 1 (2005). J.T. Heath, J.D. Cohen, and W.N. Shafarman, "The study of bulk and metastable defects in Copper Indium Gallium Diselenide using drive level capacitance profiling," J. Appl. Phys. 95, 1000 (2004). J.T. Heath, J.D. Cohen, W.N. Shafarman, D.X. Liao, and A.A. Rockett, "Effect of Ga content on defect states and minority carrier mobility in CuIn1-xGaxSe2 photovoltaic devices," Appl. Phys. Lett. 80, 4540 (2002).