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Tianbao Xie - Professor

Graf 015D
503-883-2572
txie@linfield.edu

Education: BS Beijing Uinversity 1970 MS University of Oklahoma 1984 PhD Uinversity of Oklahoma 1989

Academic Interests:
Surface Physics, Field Emission electron source and Material Science.

Publications:
1. W. A. Mackie, L. A. Southall, Tianbao Xie, G. L. Cabe, and P. H. McClelland, ?Emission characteristics of NbC/Nb field emitter array cathodes,? Journal of Vacuum Science and Technology B, 21(1), Jan/Feb (2003).
2. W. A. Mackie, L. A. Southall, Tianbao Xie, G. L. Cabe, and P. H. McClelland, ?A comparison of electron emission performance of vapor deposited carbides,? Paper delivered and submitted for publication at IVMC?02, Lyon, France, (July 2002).
3. F.M. Charbonnier, W. A. Mackie, R.L. Hartman, and Tianbao Xie, ?Robust high current field emitter tips and arrays for vacuum microelectronics devices,? Journal of Vacuum Science and Technology B, 19 (3) 1064 (2001).
4. W. A. Mackie, Tianbao Xie, K.S. Lee, L.A. Southall, and P. R. Davis, ?Performance of zirconium carbide in FEAs and as single emitters at high currents,? Paper delivered and submitted for publication at IVESC?00, Orlando, FL (2000).
5. W. A. Mackie, Tianbao Xie, K.S. Lee, A.T. McCallum, M.J. Kirby, and P. R. Davis, ?High current field emission from ZrC with differing cone angles,? Mat. Res. Soc. Symp. Proc., Vol. 558, 569 (2000).
6. F. M. Charbonnier , W. A. Mackie, T. Xie, J. E. Blackwood, and P. R. Davis, ?Enhanced field emission from carbide-coated field emitters and device applications,? Ultramicroscopy, Sep. (1999).
7. W. A. Mackie, Tianbao Xie, K. S. Lee, M. J. Kirby, and P. R. Davis, ?High current field emission from ZrC with differing cone angles films?, accepted for Mat. Res. Soc. Symp. Proc. (1999)
8. W. A. Mackie, T. Xie and P. R. Davis, "Transition Metal Carbide field Emitters for FEA Devices and High Current Applications,"J. Vac. Sci. Technol. B 17(2), 613(1999)
9. W. A. Mackie, Tianbao Xie, M.R. Matthews, and P. R. Davis, ?Emission and processing requirements for carbide films on Mo field emitters,? Mat. Res. Soc. Symp. Proc. , Vol. 509, 173 (1998)
10. W. A. Mackie, Tianbao Xie, K. S. Lee, M. J. Kirby B. R. Routh Jr., and P. R. Davis, ?High current dc and pulsed field emission from single zirconium carbide emitters in aperatures?, accepted for J. Vac. Sci. Technol. B, July, (1999).
11. W. A. Mackie, Tianbao Xie, M.R. Matthews, B.R. Routh, Jr., and P. R. Davis, ?Field emission from ZrC and ZrC films on Mo field emitters.? Journal of Vacuum Science and Technology B, 16 (4) July/Aug (1998)
12. W. A. Mackie, Tianbao Xie, J. E. Blackwood, S.C. Williams and P. R. Davis, "Hafnium carbide films and film-coated field emission cathodes?, J. Vac. Sci. Technol. B 16(3), May/Jun., 1998.
13. Tianbao Xie, W.A Mackie, and P. R. Davis, ?Field Emission from Film coated Mo Emitters (in FEAs and Single Tips) and Vapar Deposited Emitters of HfC and ZrC", Proc. 1998 IEEE International Conference, on Plasma, May, 1998.
14. J.R. Sheats, W.A. Mackie, Samir Anz, Tianbao Xie, ?Polymer electroluminescent devices with zirconium carbide cathodes?, SPIE Proceedings, Vol. 3148 (1997).
15. Tianbao Xie, W.A Mackie, and P. R. Davis, ?Emission Characteristics of ZrC and HfC Field Emitters?, Proc. 1996 Microwave Power Tube Conference (Palisades Institute for Research Services, Inc, New York, 1996).
16. Tianbao Xie, W.A Mackie, and P. R. Davis, "Field Emission from ZrC films on Si and Mo Single Emitters and Emitter Arrays", J. Vac. Sci. Technol. B 14 (3) 2090-2 (1996).
17. W. A. Mackie, T. Xie and P. R. Davis, "Field Emission from Carbide film Cathodes", J. Vac. Sci. Technol. B 13(6) 2459 (1995).
18. P.R. Davis, W.A. Mackie and Tianbao Xie, ?An investigation of the field emission characteristics of W, Mo and Si emitters with deposited ZrC films?, in 1995 Vacuum Electronics Annual Review (Palisades Institute for Research Services, Inc, New York, 1995).
19. W. A. Mackie, P. R. Davis, T. Xie and C. H. Hinrichs, ?Field emission from carbide film cathodes?, Proc. of 1994 Tri-Service/NASA Cathode Workshop, ed. J.W. Gibson, (Palisades Institute for Research Services, Inc, New York, 1994).
20. T. Xie, J. Liu, and H. J. Fischbeck, ?Further investigation of proton elastic scattering cross section on carbon and silicon?, Thin Solid Films, 236(1993) 153-158.
21. T. Xie, J. Liu, and H. J. Fischbeck, ?Energy calibration accomplished by proton resonance scattering simulation?, Thin Solid Films, 236(1993) 159-163
22. J. Liu, T, Xie, and H. J. Fischbeck, ?Nuclear resonance effects in the analysis of proton backscattering from carbon and silicon films?, Nucl. Inst. and Math. B79, 468(1993).
23. J. Liu, T, Xie, and H. J. Fischbeck, ?Resonance effects in thin film proton backscattering spectrometry?, Nucl. Inst. and Math. B56/57, 744(1991).
24.T. Xie, S. R. Ryan, and H. J.Fischbeck, ?Proton RBS measurement of the oxygen in heavy-metal oxides?, Nucl. Inst. and Meth. B40/41, 766(1989).